On June 15th, Anhui Lingguang Infrared Technology Co., Ltd. made a global debut of the LUXET VERITAS Electro-Optical Microscope along with the Laser-Induced Resistance Change (EMMI+OBIRCH) 2-in-1 Microscope in the Hefei High-tech Zone. This cutting-edge equipment seamlessly merges two primary failure analysis functions, providing extensive coverage for the detection requirements across the entire semiconductor supply chain.
