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AI-Powered Advanced Memory Testing Systems: Tsinghua-Jingzhida Joint Research Center Makes Its Debut
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Author：小编
On May 1, news emerged that the launch ceremony for the Tsinghua-Jingzhida Joint Research Center for AI-Powered Advanced Memory Testing Systems, along with the Technical Development Report Meeting, took place in the main building's reception hall on the morning of April 26. Wu Huaqiang, Vice President of Tsinghua University, and Zhang Bin, Chairman of Shenzhen Jingzhida Technology Co., Ltd., graced the occasion, jointly inaugurating the collaborative research hub. The event and subsequent report meeting were expertly moderated by Yin Shouyi, Dean of the School of Integrated Circuits at Tsinghua University.
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