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Oriental Crystal Sources Receives Patent for 'Interference Signal Compensation in Electron Beam Scanning Imaging'
1 day ago /
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Author：小编
Oriental Crystal Sources Microelectronics Technology (Beijing) Co., Ltd. has recently been awarded a patent titled 'Interference Signal Compensation Method, Device, and Electronic Device in Electron Beam Scanning Imaging', bearing the authorization number CN117011405B. This patent, granted on March 14, 2025, following an application on June 28, 2023, is poised to significantly enhance the precision and stability of electron beam scanning imaging processes. As a company specializing in integrated circuit yield management, Oriental Crystal Sources' acquisition of this patent further underscores its pioneering prowess in the realm of semiconductor detection technology.
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