Search
Xinhe Semiconductor Unveils Patent on "Grid-Cutting-Based Fast Power Integrity Analysis Method and Device"
2025-04-18 /
Read about 0 minute
Author：小编
Xinhe Semiconductor Technology (Shanghai) Co., Ltd. has successfully published its patent titled "Grid-Cutting-Based Fast Power Integrity Analysis Method and Device," with application publication number CN119538856A and a publication date of February 28, 2025. This patent introduces an innovative approach to swiftly and precisely analyze the integrity of power networks, with the objective of enhancing analysis efficiency and minimizing costs.
-
C114 Communication Network -
Communication Home
7 X 24 Track global technological trends
