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Professors Zhang Bo and Zhou Qi's Team at the University of Electronic Science and Technology of China Achieves Significant Progress in Reliability Technology for Gallium Nitride Power Devices
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Author：小编
The team led by Professor Zhang Bo from the School of Integrated Circuit Science and Engineering has made a major breakthrough in reliability technology for gallium nitride power devices. A series of findings have been published in IEEE Transactions on Power Electronics, IEEE Transactions on Electron Devices, and ISPSD, the premier conference on power semiconductors.
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