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The research group, headed by Professor Meng Xiangyue of the School of Optoelectronics at the University of the Chinese Academy of Sciences, has achieved a notable breakthrough in the development of monolithic X-ray CMOS imaging sensor chips. For the first time, the team has successfully fabricated a monolithically integrated X-ray CMOS imaging sensor utilizing ordered supramolecular bismuth halide framework materials. This groundbreaking research has been published in Chip, the sole prestigious international journal dedicated to the chip industry, under the title "Supramolecular bismuth halide frameworks for monolithic X-ray CMOS imagers". X-ray imaging technology finds widespread applications in various domains, including medical CT diagnostics, public security screenings, and industrial non-destructive testing.
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