Based on data from Tianyancha, Hangzhou Accelerated Technology Co., Ltd. has officially been granted a patent for its innovative technology titled "Light Source Calibration Method, Device, and Optical Chip Testing System," specifically designed for optical chip testing. The patent, bearing the authorization announcement number CN116298804B, was officially authorized on October 17, 2025, following an application submitted on March 28, 2023.

This patented technology introduces a light source calibration method rooted in the principles of the gradient descent algorithm. It involves establishing a linear relationship between light source voltage parameters and brightness levels. By carefully selecting the optimal voltage parameters for calibration, the method ensures efficient and precise light source calibration, thereby significantly boosting the overall efficiency of chip testing processes.