This article zeroes in on the high-speed ADDA (Analog-to-Digital and Digital-to-Analog) chips embedded within 800G DSP (Digital Signal Processing) chips. It delves into their operational mechanics and the hurdles encountered during ATE (Automated Test Equipment) testing. ADDA chips seamlessly blend ADC (Analog-to-Digital Converter) and DAC (Digital-to-Analog Converter) capabilities, facilitating seamless bidirectional signal conversion between the analog and digital realms. They act as a vital bridge connecting the tangible physical world with sophisticated digital systems. With the relentless progression of chip technology, the integration density of ADDA chips escalates, but this advancement is paralleled by a surge in ATE testing complexity. This, in turn, results in prolonged test durations and elevated costs. To overcome the obstacles posed by high-volume production testing, it becomes imperative to adopt efficient testing methodologies, such as integrated testing apparatuses and automated testing workflows. These strategies are essential for curbing expenses, boosting testing efficacy, and guaranteeing optimal chip yields.