Recently, Professor Wang Youyang, a faculty member at the School of Microelectronics (also known as the School of Integrated Circuits) at Nanjing University of Science and Technology, achieved a significant milestone. Serving as the lead author, he published a groundbreaking research paper titled "ANN-Assisted Switching Loss Prediction for SiC MOSFET Power Modules" in IEEE Transactions on Power Electronics, a prestigious international journal renowned in the field of power semiconductors.

This collaborative research effort was undertaken in conjunction with the R&D team headed by Dr. Li Daohui, the Deputy General Manager of Beijing Xingal Technology (Group) Co., Ltd. Professor Gu Wenhua, also from the School of Microelectronics, played a pivotal role as the corresponding author. Nanjing University of Science and Technology is credited as the primary institution responsible for the completion of this research.