Recently, a collaborative research team comprising Zhu Ziyao and Xu Xiumin from Anhui University, along with the team headed by Associate Researcher Li Yunlong from the Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, has introduced an innovative X-ray detection principle. This principle is grounded in direct-type metal halide perovskite semiconductors. The pertinent research findings have been featured in the esteemed journal Science Advances, under the article title “Polycrystalline MAPbI3 AC-bias Direct X-ray Detectors for 3D Reconstruction” (DOI: 10.1126/sciadv.adx8785). Notably, the School of Integrated Circuits at Anhui University is credited as the primary affiliated institution, with Zhu Ziyao, a lecturer at the school, assuming the role of the paper's first author.