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Chinese Researchers Innovate 'Soft Approach to Hard Challenges' in Non-Destructive Testing of Micro LED Wafers
3 day ago /
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Author：小编
Micro LEDs, the cornerstone of next-generation high-end display technology, necessitate a 100% yield rate for their wafers to keep repair costs manageable. Yet, the industry has grappled with the absence of effective non-destructive contact testing methods for these wafers. Recently, Chinese researchers have ingeniously bridged this technological divide through the adoption of innovative flexible technology.
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