Recently, Wang Chunyang, a researcher from the Shenyang National Laboratory for Materials Science at the Institute of Metal Research, Chinese Academy of Sciences, joined forces with an international team to employ in-situ transmission electron microscopy. This groundbreaking collaboration led to the first-ever revelation of the nanoscale cause of sudden short circuits in solid-state batteries, along with a proposed solution. The significant findings of this research were published in the prestigious Journal of the American Chemical Society on May 20.
