On September 24, sources within the industry revealed that Oukangnuo, a leading Chinese manufacturer specializing in storage SLT (System-Level Testing) equipment, is set to collaborate with Hygon Information to establish a localized testing platform for memory and storage chips. Leveraging Hygon Information's CPUs as the central component, Oukangnuo is forging connections with top-tier domestic storage chip producers. These partners will supply the foundational DRAM chip testing technology, which, when integrated with Oukangnuo's independently developed testing equipment, will form the backbone of this localized testing platform. The two companies aim to officially unveil the product by the end of this year. Presently, the project has reached the final phase of joint debugging, with expectations for the product to achieve full maturity and become publicly available by the end of October.