Endorsed by the State Administration for Market Regulation and the Standardization Administration of China, the national standard titled 'Intelligent Computing - Test Methods for Memristors - Part 2: Linearity' (GB/T 46567.2-2026), which was formulated under the guidance of the Institute of Microelectronics, was officially published on April 30, 2026, and is set to take effect on November 1 of the same year. Memristors, as pivotal components in the realization of novel integrated memory and computing architectures, are crucial for advancing technology in this field. This standard meticulously outlines the testing environment, equipment, parameters, and methodologies for assessing memristor linearity, thereby offering thorough standardized guidance for the systematic evaluation of memristors. This evaluation spans from their fundamental characteristics to linearity and extends to their plasticity functions, ensuring a comprehensive and structured approach to memristor testing.