Recently, Professor Zhu Limin's research team from the Institute of Intelligent Manufacturing and Information Engineering, School of Mechanical Engineering at Shanghai Jiao Tong University, has unveiled a groundbreaking cross-scale, high-bandwidth atomic force microscope (AFM) that leverages stick-slip nanopositioners. This innovative technology effectively addresses a longstanding limitation in traditional AFMs: the challenge of simultaneously achieving a large scanning range and high bandwidth. The new AFM boasts an impressive control bandwidth of up to 363Hz and an expansive working range of 3mm×3mm. It has successfully accomplished AFM imaging of millimeter-scale areas at a rapid line rate of 40Hz. By employing a triple-phase control strategy, the research team has redefined the role of stick-slip nanopositioners, traditionally used for coarse positioning. Now, these nanopositioners can simultaneously deliver nanoscale precision, millimeter-scale travel capabilities, and high-bandwidth scanning, thereby offering a cross-scale, high-bandwidth solution poised to revolutionize the next generation of AFMs.