The Institute of Semiconductors-Led International Standard: "Raman Spectroscopy Method for Measuring the Layer Count in Graphene Films" Officially Released - Chip

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The Institute of Semiconductors-Led International Standard: "Raman Spectroscopy Method for Measuring the Layer Count in Graphene Films" Officially Released

2025-10-15 / Read about 0 minute

Author：小编

The international standard titled "Raman Spectroscopy Method for Measuring the Layer Count in Graphene Films," developed under the auspices of the Institute of Semiconductors, has now been formally unveiled.

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