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Jeta Semiconductor's Patent for 'Failure Test Circuit and Method' Officially Published
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Author：小编
On March 14, 2025, Shanghai Jeta Semiconductor Co., Ltd. saw the publication of its patent titled 'Failure Test Circuit and Method,' carrying the publication number CN119619786A. This patent innovatively safeguards the integrity of failure locations during the secondary breakdown phase of the device under test. It accomplishes this by linking the device under test with a protection module in series, ultimately enhancing both the efficiency and precision of the testing process.
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