Recently, a collaborative team led by Professor Wei Jingxuan and Professor Liu Yong from the School of Optoelectronic Science and Engineering, as well as the National Key Laboratory of Electronic Thin Films and Integrated Devices at the University of Electronic Science and Technology of China, has made a significant contribution to the scientific community. Alongside researchers from the Suzhou Institute of Nano-Tech and Nano-Bionics of the Chinese Academy of Sciences and the National University of Singapore, they published a comprehensive review article titled "Polarization‑Sensitive Photoelectric Conversion" in the internationally acclaimed journal Chemical Reviews.

This research effort was bolstered by support from key projects, including the Original Exploration Project funded by the National Natural Science Foundation of China and the National Key Research and Development Program. Leveraging the principle of symmetry, the paper introduced an innovative physical framework that facilitates the "information mapping" process from multidimensional photonic parameters to multidimensional electronic degrees of freedom.

The review meticulously examined the advancements and fundamental physical mechanisms underlying polarization photoelectric effects across various cutting-edge material systems. Furthermore, it offered a visionary perspective on the future design of high-performance full-Stokes polarization detectors and the integration of on-chip optoelectronic systems, paving the way for new breakthroughs in the field.