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NK Shape Optical Critical Dimension (OCD) Metrology Gear Successfully Supplied to Local Customer
2025-12-23 /
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Author：小编
Shanghai Nauritech Semiconductor Equipment Co., Ltd. has recently rolled out its latest Optical Critical Dimension (OCD) metrology apparatus, the NKShape line. This innovative range of equipment has already been smoothly delivered to a customer within the country. Tailored precisely for cutting-edge semiconductor production processes, this product series is adept at performing critical dimension metrology tasks in intricate structures, including but not limited to Planar Gate, FinFET, DRAM, and 3D-NAND configurations.
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