Recently, the research team headed by Professor Ming Xin of the Power Integration Technology Laboratory, School of Integrated Circuit Science and Engineering at the University of Electronic Science and Technology of China, made a significant breakthrough. Their research on low-power, fast-transient technology for Low Dropout Regulators (LDOs) was published in the IEEE Journal of Solid-State Circuits (JSSC), a premier journal in the integrated circuit field.
This innovative technology utilizes a load current recycling and active clamping control framework. As a result, it achieves an incredibly low quiescent power consumption of just 8.2μA. Simultaneously, it can effectively manage both high- and low-frequency load transient spikes. By doing so, it reduces the LDO transient figure of merit to an impressive 41ps. Moreover, it marks the first instance in the industry where high-current LDOs have demonstrated the fastest high-frequency load-step response capability, with a 10μs interval.
This accomplishment holds the potential to substantially improve high-speed photography capabilities in smartphones and drones. Professor Ming Xin acted as the first and corresponding author, while master's student Kuang Jianjun was credited as the second author.