On the afternoon of October 30th, Songjiang District and Tongji University convened an exchange symposium. During this event, the National Industrial Metrology and Testing Center (Shanghai) for Integrated Circuit Micro-Nano Testing Equipment, primarily led by Tongji University in partnership with Zhangjiang Laboratory, was formally inaugurated in Songjiang and commenced operations at the University of Science and Technology of China Intelligent Industrial Park. As a pioneer among the initial batch of national-level industrial metrology and testing centers specializing in integrated circuits nationwide, this center is committed to tackling the technical hurdles associated with chips that are "untestable, incompletely tested, or inaccurately tested," thereby offering crucial metrological backing to boost the production yield of domestically manufactured chips. Additionally, the symposium unveiled the design blueprint for the metrology and testing center, along with the design scheme for the light research and development (R&D) regional functions of the Tongji University Yangtze River Delta G60 Sci-Tech Innovation Corridor Research Institute. Moreover, the event witnessed the signing of multiple cooperation agreements and the launch of various initiatives.