SensingTech Unveils Patent for Material Defect Detection Innovation
2025-08-24 / Read about 0 minute
Author:小编   

Shanghai SensingTech Network Technology Co., Ltd. has officially announced the issuance of a patent titled "A Material Defect Detection Method, Device, and Storage Medium," bearing the application publication number CN119643580A and published on March 18, 2025. This groundbreaking patent falls under the realm of material defect detection, with the primary objective of enhancing both detection efficiency and accuracy.